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ENEPIG-blog-image-K-ALPHATo achieve the highest level of precision for your ENEPIG coating thickness measurement, look for an XRF instrument that features both Optics and Silicon Drift Detector (SDD).

X-ray Fluorescence is a powerful, accurate, and well-established method of coating thickness measurement as well as the elemental microanalysis of materials. The addition of Optics plus SDD enable this proven method to deliver even more precision than before, and on very small components.  The poly-capillary optics achieve a hundred times higher flux than collimation system at the same distance from the source – easily achieving the best precision at the shortest test time with small spot testing requirements. The high flux x-ray beam and large window SDD combine for unmatched speed and performance.

Application Performance

  µm Au µm Pd µm Ni
Avg. 0.0427 0.08 3.72
Std. Dev. 0.00045 0.0009 0.00985
Range 0.0015 0.003 0.0395
% RSD 1.053% 1.121% 0.265%

This XRF+Optics+SDD method is perfect for ENEPIG applications as it delivers fast, multi-point, automated analysis on sample sizes as small as 30 µm.  Users will save time, money and materials.

ENEPIG (Electroless Nickel / Electroless Palladium / Immersion Gold) plating is the chemical deposition of one or more layers of a metal coating onto an object using chemical reactions rather than electricity. ENEPIG plating is favored because of its suitability for both lead-free soldering and wire bonding applications. ENEPIG can be used for all assembly processes, and brittle fracture on BGAs is not an issue with this combination of metallic layers. The production flow is shortened when ENEPIG plating is used, as only one final finish is applied and no protective film masking is necessary.

ENEPIG advantages are:

  • Excellent shelf life
  • Solder joint reliability
  • Gold wire bond-ability
  • Able to be used as a contact surface

The BOWMAN Xray System is designed with proprietary hardware and special software for measuring and quantifying multiple layer electroless platings, such as ENEPIG, over various substrates.  To learn more about the Bowman Analytics XRF Optics unit, visit today.

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