Advanced thin film measurement using u-spot poly-capillary optics
BOWMAN is proud to introduce the second generation of cutting edge XRF instrumentation, the Xray Optics System. The small spot, high flux x-ray beam and large window SDD detector combine for unmatched speed and performance. It can be the perfect tool for minimizing wasted time, money, and materials.
- Poly-capillary optics achieves hundred times higher flux than collimation system at the same distance from the source
- This provides best precision at shortest test time with small spot
- Small Feature Analysis With Incredible Accuracy And Precision
- Flux Density Gain Up To 5 Orders Of Magnitude Compared To Collimator
- Equipped With Large Window SDD
- Designed For ENIG, ENEPIG, And Electroless Nickel % P Analysis