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Advanced thin film measurement using u-spot poly-capillary optics

BOWMAN is proud to introduce the second generation of cutting edge XRF instrumentation, the Xray Optics System. The small spot, high flux x-ray beam and large window SDD detector combine for unmatched speed and performance. It can be the perfect tool for minimizing wasted time, money, and materials.

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X-ray excitation 50 W Micro-Focused Mo target with Capillary Optics @80um FWHM
Detector Silicon drifted detector with 135eV resolution
Number of analysis layers and elements 5 layers (4 layers + base) and 10 elements in each layer, Composition analysis of up to 25 elements simultaneously
Primary Filters 2 primary filters
Focal Depth Fixed at 0.1”
Digital Pulse Processing 4096 CH digital multi-channel analyser with flexible shaping time, Automatic signal processing including dead time correction and escape peak correction
Computer Intel, CORE i5 3470 Processor (3.2GHz), 8GB DDR3 Memory, Microsoft Windows 8 Professional 64bit equivalent
Camera optics 1/4” CMOS-1280×720 VGA resolution, 45X on 15” screen
Power Supply 150W, 100~240 volts, with frequency range of 47Hz to 63Hz
Working Environment 50°F (10°C) to 104°F (40°C) and up to 98% RH, non-condensing
Weight 53 kg
Programmable XY Table size: 15” x 13” | Travel: 6” x 5”
Internal Dimensions Height: 140mm (5.5”), Width: 310mm (12”) , Depth: 210mm (8.3”)
External Dimensions Height: 450 mm (18”), Width: 450 mm (18”), Depth: 600 mm ( 24″)