High Performance X-Ray Fluorescence Analyzer for Coating Thickness Measurement, Elemental Analysis, and Solution Analysis
The BOWMAN Xray System is a precision desktop instrument for measuring the thickness of coatings on a substrate. With our specialized detection technology and sophisticated software, we can also tell what elements are present in the sample. The instrument can measure up to five coating layers simultaneously, any two of which can be alloys.
It uses a specially designed micro spot focus x-ray tube as the energy source, a temperature-stabilized silicon PIN diode as the detector and a wide bandwidth, multichannel amplifier to sort and count the radiated photons. BOWMAN Xralizersoftware uses unique software algorithms that identify and measure the thickness of the materials from the detected photons.
A micro focus video camera, aligned with the x-ray optics axis, is used to accurately select the area on the sample to be measured. An elevator, manually or automatically controlled by a focus laser, accommodates measurement samples of varying heights.
The engineering result of years of product development and user feedback the BOWMAN Xray System provides fast, easy and high-performance XRF analysis designed to meet even the strictest customer specifications. A smart compact design makes analysis convenient for a variety of applications—all at an affordable price to maximize your quality control ROI.
- Fast non-destructive analysis within seconds
- Simultaneous composition analysis of up to 25 elements
- Measure up to five coating layers simultaneously, any two of which can be alloys
- Fundamental Parameters (FP)-driven standard-less thickness and composition analysis
- Easy setup and operation-one USB cable connection
- Simple front panel controls
- Small footprint